AFM-R All-In-One Raman Atomic Force Microscope

Sample Size
Φ≤90mm, H≤20mm

Optical Mag.
10X(Optional: 20X)

Resolution
X/Y: 0.2 nm, Z: 0.05nm

Feedback sampling rate
64.0KHz

USB2.0/3.0

Integrated Raman Spectrometer with Atomic Force Microscope’s functions simultaneously, you can observe the 3-D morphology of sample while analyze the material composition
Built-in 10X apochromatic objective without focusing for viewing probe tip and Raman laser spot
Collecting the AFM and Raman data from the same point without moving the sample, in-situ detecting the morphology and chemical information of the sample
Scan head, laser coupler and sample scanning stage are designed together, strong anti-vibration stable performance
Precision laser detection and probe alignment device make laser adjustment simple and easy
Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
Adopt spring for vibration isolation, simple and good performance
Metal soundproof and built-in high-precision temperature-humidity sensor for real-time monitoring of working environment
Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

Specification for AFM-R
Basic Operation Modes	Contact mode, Tapping mode, F-Z curve measurement, RMS-Z curve measurement, Friction/Lateral, Amplitude/Phase, Magnetic/ Electrostatic
Sample Size	Φ≤90mm，H≤20mm
Max. Scan Range	XY:20μm, Z: 2μm (Optional: XY: 50μm, Z:5μm
Resolution	X/Y: 0.2 nm, Z: 0.05nm
Sample movement	0~20mm
Optical Mag.	10X(Optional: 20X)
Optical Resolution	1μm(Optional: 0.8μm)
Scan rate	0.6Hz~4.34Hz
Scan angle	0~360°
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Feedback Mode	DSP digital feedback
Feedback sampling rate	64.0KHz
Interface	USB2.0/3.0
Operation Environment	Compatible with WindowsXP/7/8/10

Specification for Raman Spectrometer
Wave Length	532±0.05nm, (Optional: 785±0.05nm)
Continuous Output	＞500Mw (50-600mW Continuous Adjustment)
Wavelength-Stability	＜0.05nm
Power Stability	＜2% (within 2 hours)
Lifetime	＞10000 hours
Drift Range	50-4000cmˉ¹
Resolution	＜3cmˉ¹
Dynamic Range	8000:1
Integral Time	17ms-100s
Linearity	＞99.8%
Operation Environment	Compatible with WindowsXP/7/8
Auto Peak Searching	Support
Raman Database	(Optional)Up to 3000 Common Data, support upgrade
Development Raman Database	Support
Data Input & Output	Support
Analysis Software	Raman Analysis 2

Application for AFM-R
Material Science		Observation and research of material surface, including surface roughness, surface structure, particle size, defects etc. metal and alloy, thin film, liquid crystal, crystal, superconductor etc.
Micro-electronics		Automatic on-line detection of LSI, study the local electrical characteristics of IC. It is also used in the ultra-high density information storage and retrieval research.
Biology		DNA, Chromatin structure, Protein/Protease enzyme Reaction, Protein adsorption, Biological macromolecules react to cell surface antigens and intracellular proteins, the movement and morphology of cells, the unraveling of chromosome binding.
Medical Science		A powerful means of mesoscopic manipulation, including drugs, pharmacology, immunology, diagnosis and treatment etc.
Optics		Integrate optical technology with AFM technology to form a brand-new subject: near-field optics. It is a combination of super resolution in AFM’s san apperance and the merits of optical scanning.
Physics		Scan the surface electron structures, energy levels, wave functions etc. Mesoscopic physics can be carried out.
Chemistry		AFM is an effective in situ detection tool, study the surface chemical reactions at the atomic level, meanwhile detect the change of atomic in surface chemical reaction.