Scanning Probe Microscopes
Atomic Force Microscope has solved many demerits of other morphologic observation equipment, such as electron microscope SEM/TEM, LSCM and surface profilometer. It is widely applied to various fields: size, roughness, surface structure, particle size, defects etc.
Categories
AFM-IN
AFM-IN Industrial Grade Atomic Force Microscope USB2.0/3.0, Industrial detection, Pneumatic Shock Absorber
STM-T
STM-T Teaching-Oriented Scanning Tunnel Microscope USB2.0/3.0, suitable for teaching
AFM-T
AFM-T Teaching-Oriented Atomic Force Microscope USB2.0/3.0, portable and convenient, suit for teaching field
AFM-O
AFM-O All-In-One Compound Optical Atomic Force Microscope with CCD Camera & Display USB2.0/3.0, Eyepiece & Objective, 11.6 inch Flat-panel display
AFM-R
AFM-R All-In-One Raman Atomic Force Microscope USB2.0/3.0, 10X apochromatic objective, Raman Spectrometer
AFM-I
AFM-I Integrated Atomic Force Microscope with 10X apochromatic objective High –precision & Large scale Piezoceramic Tube Scanner, USB2.0/3.0
AFM-M
AFM-M Multi-mode Atomic Force Microscope USB2.0/3.0, metal soundproof, built-in high-precision temperature-humidity sensor