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AFM-IN Industrial Grade Atomic Force Microscope


USB2.0/3.0, Industrial detection, Pneumatic Shock Absorber


  • Scanning without moving the sample
  • Closed-loop 3-axis independent piezoelectric translational scanner
  • Large travel 2-D electric sample moving stage
  • High magnification optical position system
  • Convenient laser spot adjustment mode
  • Intelligent injection mode
  • Pneumatic shock absorber

Tags: Atomic Force MicroscopeScanning Probe Microscope

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Closed-loop Scan Range
XY:100μm, Z: 10μm
Sample movement
Optical Position
10X Objective
Noise Level
  • Scanning without moving the sample
  • Adopt with closed-loop 3-axis independent piezoelectric translational scanner for large scale and high precision scanning
  • Superior suitable for detection of super large sample, such as integrated circuit wafer. The size and weight of sample are not limited
  • Portal Form scanning head design, marble base, and vacuum adsorption type stage
  • Large travel 2-D electric sample moving stage for choosing sample area which you are interested in quickly
  • High magnification optical position system for precision position of probe and sample scanning area
  • Convenient laser spot adjustment mode, you can operate real-time observation and spot adjustment through optical CCD window
  • Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
  • Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
  • Equipped with closed metal shield, pneumatic shock absorber, strong anti-interference ability
  • Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

Specification for AFM-IN

Basic Operation Modes

Contact mode, Tapping mode, F-Z curve measurement, RMS-Z curve measurement, Friction/Lateral, Amplitude/Phase, Magnetic/ Electrostatic

Optional Operation Modes

Profile Rapid Measurement mode

Max. Sample Size


Max. Closed-loop Scan Range

XY:100μm, Z: 10μm


X/Y: 0.2 nm, Z: 0.05nm

Sample movement


Aux. Optical Position

10X Objective (Optional: 20X)

Optical Resolution

1μm (Optional: 0.8μm)

Pneumatic Shock Absorber

Frequency: 0.5Hz

Noise Level


Scan rate


Scan angle


Scanning control

XY: 18-bit D/A, Z: 16-bit D/A

Data sampling

One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously

Feedback Mode

DSP digital feedback

Feedback sampling rate




Operation Environment

Compatible with WindowsXP/7/8/10

Application for AFM-IN

Material Science

Observation and research of material surface, including surface roughness, surface structure, particle size, defects etc. metal and alloy, thin film, liquid crystal, crystal, superconductor etc.


Automatic on-line detection of LSI, study the local electrical characteristics of IC. It is also used in the ultra-high density information storage and retrieval research.


DNA, Chromatin structure, Protein/Protease enzyme Reaction, Protein adsorption, Biological macromolecules react to cell surface antigens and intracellular proteins, the movement and morphology of cells, the unraveling of chromosome binding.

Medical Science

A powerful means of mesoscopic manipulation, including drugs, pharmacology, immunology, diagnosis and treatment etc.


Integrate optical technology with AFM technology to form a brand-new subject: near-field optics. It is a combination of super resolution in AFM’s san apperance and the merits of optical scanning.


Scan the surface electron structures, energy levels, wave functions etc. Mesoscopic physics can be carried out.


AFM is an effective in situ detection tool, study the surface chemical reactions at the atomic level, meanwhile detect the change of atomic in surface chemical reaction.

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