The electric scientific research grade material testing microscope CM120BD-AF adopts a new semi- apo technology, which integrates multiple observations, such as bright field, dark field, and polarization. Any observation can present clear and sharp microscopic images, or functional selection can be made according to actual applications.
It is an effective machine for industrial testing. Adopts an electric quintuple nosepiece, with dual control of physical buttons and software, for remote digit adjustment. Equipped with a 12-inch large platform area, especially for large-sized semiconductor FPD inspection, circuit board slicing measurement, and wafer testing. This machine is also suitable for analysis and testing of metallographic materials and polymer materials.
Equipped with a polarization system, including polarizer and analyzer inserts, which can perform polarization testing. In semiconductor and PCB testing, it can eliminate stray light and provide clearer details.
The 360°rotating analyzer can conveniently observe the state of the specimen under different polarization angles of light without moving the specimen. At the same time, a DIC prism can be inserted on the basis of orthogonal polarization for DIC differential interference phase contrast observation. DIC technology can create a significant relief effect on the small height differences on the surface of objects, greatly improving image contrast and making it particularly suitable for observing conductive particles.
CM120BD-AF Electric Metallurgical Microscope with its 4K Camera