VM3000BDDIC Inverted Metallurgical Microscope adopts excellent optical system, equipped with superior optical performance. Its compact and stable body reflect the function of anti-vibration. Modular functional design to achieve polarization observation, dark field observation, bright field differential interference observation and other functions. The ideal ergonomic design will make easier and more convenient operation. It can be used for microobservation of semiconductor silicon wafer, LCD substrate, solid powder and other industrial samples. It is the ideal instrument for material science, precision electronic engineering etc. The gemel mode binocular is inclined 45°. The operator cervix and shoulder are released from tired in period of time keeping bow or head-up. The eyepatch can be added.
The circular chromeplate substage is located in the center of mechanical stage so that enable rotate the specimen in the polarization observation. The abnormity observation window is suit for different size specimen.
Equip high quality bright and dark field objectives and dark field illumination device. Avoid the stray light of illumination system and improve the image quality in the dark field.
The photographic observation output is setting up on the back of main body frame, so that the accessories of camera don’t cause interference to eyepiece observation. Microphotography in 100% light flux, suits for low illuminance microphotography.
VM3000BDDIC
Head & Mechanical Stage of VM3000BDDIC
Illumination System & Photography Unit of VM3000BDDIC
Diagram of VM3000BDDIC
