Microscope X / Scanning Probe Microscopes / AFM-I
Atomic Force Microscope Scanning Probe Microscope

AFM-I

AFM-I Integrated Atomic Force Microscope with 10X apochromatic objective

High –precision & Large scale Piezoceramic Tube Scanner, USB2.0/3.0

Core Features
  • stable anti-vibration performance
  • precision laser detection
  • piezoceramic tube scanner
  • single axle drive for accurate scanning
  • motor controls the intelligent injection mode
Configurations
Scan rate
0.6Hz~4.34Hz
Scan angle
0~360°
USB2.0/3.0
10X(Optional: 20X)
DSP digital feedback
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AFM-I
  • Scan head and sample scanning stage are designed together, strong anti-vibration stable performance
  • Precision laser detection and probe alignment device make laser adjustment simple and easy
  • Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
  • Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
  • High –precision & Large scale Piezoceramic Tube Scanner, change according to different accuracy and scanning range requirements
  • Optical position, 10X apochromatic objective without focusing for real-time observation and locating scanning area of probe sample
  • Adopt spring for vibration isolation, simple and good performance
  • Metal soundproof and built-in high-precision temperature-humidity sensor for real-time monitoring of working environment
  • Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

AFM-I