AFM-IN Industrial Grade Atomic Force Microscope

AFM-IN

USB2.0/3.0, Industrial detection, Pneumatic Shock Absorber

Core Features

Configurations

Closed-loop Scan Range

XY:100μm, Z: 10μm

Sample movement

300mm×300mm

Optical Position

10X Objective

Noise Level

＜0.1nm

Scanning without moving the sample
Adopt with closed-loop 3-axis independent piezoelectric translational scanner for large scale and high precision scanning
Superior suitable for detection of super large sample, such as integrated circuit wafer. The size and weight of sample are not limited
Portal Form scanning head design, marble base, and vacuum adsorption type stage
Large travel 2-D electric sample moving stage for choosing sample area which you are interested in quickly
High magnification optical position system for precision position of probe and sample scanning area
Convenient laser spot adjustment mode, you can operate real-time observation and spot adjustment through optical CCD window
Sample approaches the probe vertically automatically with single axle drive, locating the scanned area accurately, and making the tip perpendicular to the sample scanning
Intelligent injection mode for automatic detection of pressurized electrical ceramics controlled by motor, for protecting the probe and sample
Equipped with closed metal shield, pneumatic shock absorber, strong anti-interference ability
Integrated scanner hardware nonlinear correction user editor, nano-characterization and measurement accuracy is better than 98%

Specification for AFM-IN
Basic Operation Modes	Contact mode, Tapping mode, F-Z curve measurement, RMS-Z curve measurement, Friction/Lateral, Amplitude/Phase, Magnetic/ Electrostatic
Optional Operation Modes	Profile Rapid Measurement mode
Max. Sample Size	Φ≥300mm，H≥50mm
Max. Closed-loop Scan Range	XY:100μm, Z: 10μm
Resolution(Closed-loop)	X/Y: 0.2 nm, Z: 0.05nm
Sample movement	300mm×300mm
Aux. Optical Position	10X Objective (Optional: 20X)
Optical Resolution	1μm (Optional: 0.8μm)
Pneumatic Shock Absorber	Frequency: 0.5Hz
Noise Level	＜0.1nm
Scan rate	0.6Hz~4.34Hz
Scan angle	0~360°
Scanning control	XY: 18-bit D/A, Z: 16-bit D/A
Data sampling	One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Feedback Mode	DSP digital feedback
Feedback sampling rate	64.0KHz
Interface	USB2.0/3.0
Operation Environment	Compatible with WindowsXP/7/8/10

Application for AFM-IN
Material Science		Observation and research of material surface, including surface roughness, surface structure, particle size, defects etc. metal and alloy, thin film, liquid crystal, crystal, superconductor etc.
Micro-electronics		Automatic on-line detection of LSI, study the local electrical characteristics of IC. It is also used in the ultra-high density information storage and retrieval research.
Biology		DNA, Chromatin structure, Protein/Protease enzyme Reaction, Protein adsorption, Biological macromolecules react to cell surface antigens and intracellular proteins, the movement and morphology of cells, the unraveling of chromosome binding.
Medical Science		A powerful means of mesoscopic manipulation, including drugs, pharmacology, immunology, diagnosis and treatment etc.
Optics		Integrate optical technology with AFM technology to form a brand-new subject: near-field optics. It is a combination of super resolution in AFM’s san apperance and the merits of optical scanning.
Physics		Scan the surface electron structures, energy levels, wave functions etc. Mesoscopic physics can be carried out.
Chemistry		AFM is an effective in situ detection tool, study the surface chemical reactions at the atomic level, meanwhile detect the change of atomic in surface chemical reaction.