USB2.0/3.0, portable and convenient, suit for teaching field
Specification for AFM-T
Basic Operation Modes
Tapping mode, RMS-Z curve measurement
Optional Operation Modes
Contact mode, F-Z curve measurement, Friction/Lateral, Amplitude/Phase, Magnetic/ Electrostatic
Max. Scan Range
XY:20μm, Z: 2μm
X/Y: 0.2 nm, Z: 0.05nm
XY: 18-bit D/A, Z: 16-bit D/A
One 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
DSP digital feedback
Feedback sampling rate
Compatible with WindowsXP/7/8/10
Application for AFM-T
Observation and research of material surface, including surface roughness, surface structure, particle size, defects etc. metal and alloy, thin film, liquid crystal, crystal, superconductor etc.
Automatic on-line detection of LSI, study the local electrical characteristics of IC. It is also used in the ultra-high density information storage and retrieval research.
DNA, Chromatin structure, Protein/Protease enzyme Reaction, Protein adsorption, Biological macromolecules react to cell surface antigens and intracellular proteins, the movement and morphology of cells, the unraveling of chromosome binding.
A powerful means of mesoscopic manipulation, including drugs, pharmacology, immunology, diagnosis and treatment etc.
Integrate optical technology with AFM technology to form a brand-new subject: near-field optics. It is a combination of super resolution in AFM’s san apperance and the merits of optical scanning.
Scan the surface electron structures, energy levels, wave functions etc. Mesoscopic physics can be carried out.
AFM is an effective in situ detection tool, study the surface chemical reactions at the atomic level, meanwhile detect the change of atomic in surface chemical reaction.
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