Scanning Probe Microscopes
Atomic Force Microscope has solved many demerits of other morphologic observation equipment, such as electron microscope SEM/TEM, LSCM and surface profilometer. It is widely applied to various fields: size, roughness, surface structure, particle size, defects etc.
Categories
AFM-IN Industrial Grade Atomic Force Microscope
USB2.0/3.0, Industrial detection, Pneumatic Shock Absorber
- Scanning without moving the sample
- Closed-loop 3-axis independent piezoelectric translational scanner
- Large travel 2-D electric sample moving stage
- High magnification optical position system
- Convenient laser spot adjustment mode
- Intelligent injection mode
- Pneumatic shock absorber
STM-T Teaching-Oriented Scanning Tunnel Microscope
USB2.0/3.0, suitable for teaching
- Compact and detachable design
- Motor controls Intelligent injection mode
- Lateral CCD View System
- Spring for vibration isolation
AFM-T Teaching-Oriented Atomic Force Microscope
USB2.0/3.0, portable and convenient, suit for teaching field
- Compact and detachable
- Precision laser detection
- Probe alignment device
- 4X Objective without focusing
- Motor controls intelligent injection mode
- Spring for vibration isolation
AFM-O All-In-One Compound Optical Atomic Force Microscope with CCD Camera & Display
USB2.0/3.0, Eyepiece & Objective, 11.6 inch Flat-panel display
- Photoelectricity control integration
- Optical 2-D measurement & atomic force microscope’s 3-D measurement
- Vertical light path
- High-magnification optical position
- Convenient laser spot adjustment mode
- Pneumatic shock absorber
AFM-R All-In-One Raman Atomic Force Microscope
USB2.0/3.0, 10X apochromatic objective, Raman Spectrometer
- Built-in 10X apochromatic objective
- Precision laser detection
- Probe alignment device
- Motor controls Intelligent injection mode
- Spring for vibration isolation
- Built-in high-precision temperature-humidity sensor
AFM-I Integrated Atomic Force Microscope with 10X apochromatic objective
High –precision & Large scale Piezoceramic Tube Scanner, USB2.0/3.0
- stable anti-vibration performance
- precision laser detection
- piezoceramic tube scanner
- single axle drive for accurate scanning
- motor controls the intelligent injection mode
AFM-M Multi-mode Atomic Force Microscope
USB2.0/3.0, metal soundproof, built-in high-precision temperature-humidity sensor
- strong anti-vibration performance
- simple and easy laser adjustment
- single axle drive for accurate scanning
- motor controls the intelligent injection mode
- adopt spring for vibration isolation
- optical position for real-time observation and locating scanning area of probe sample
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