Atomic Force Microscope has solved many demerits of other morphologic observation equipment, such as electron microscope SEM/TEM, LSCM and surface profilometer. It is widely applied to various fields: size, roughness, surface structure, particle size, defects etc.
USB2.0/3.0, Industrial detection, Pneumatic Shock Absorber
USB2.0/3.0, suitable for teaching
USB2.0/3.0, portable and convenient, suit for teaching field
USB2.0/3.0, Eyepiece & Objective, 11.6 inch Flat-panel display
USB2.0/3.0, 10X apochromatic objective, Raman Spectrometer
High –precision & Large scale Piezoceramic Tube Scanner, USB2.0/3.0
USB2.0/3.0, metal soundproof, built-in high-precision temperature-humidity sensor