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Scanning Probe Microscope
Microscope X
Products
Scanning Probe Microscope
AFM-IN Industrial Grade Atomic Force Microscope
Scanning without moving the sample
Closed-loop 3-axis independent piezoelectric translational scanner
Large travel 2-D electric sample moving stage
High magnification optical position system
Convenient laser spot adjustment mode
Intelligent injection mode
Pneumatic shock absorber
STM-T Teaching-Oriented Scanning Tunnel Microscope
Compact and detachable design
Motor controls Intelligent injection mode
Lateral CCD View System
Spring for vibration isolation
AFM-T Teaching-Oriented Atomic Force Microscope
Compact and detachable
Precision laser detection
Probe alignment device
4X Objective without focusing
Motor controls intelligent injection mode
Spring for vibration isolation
AFM-O All-In-One Compound Optical Atomic Force Microscope with CCD Camera & Display
Photoelectricity control integration
Optical 2-D measurement & atomic force microscope’s 3-D measurement
Vertical light path
High-magnification optical position
Convenient laser spot adjustment mode
Pneumatic shock absorber
AFM-R All-In-One Raman Atomic Force Microscope
Built-in 10X apochromatic objective
Precision laser detection
Probe alignment device
Motor controls Intelligent injection mode
Spring for vibration isolation
Built-in high-precision temperature-humidity sensor
AFM-I Integrated Atomic Force Microscope with 10X apochromatic objective
stable anti-vibration performance
precision laser detection
piezoceramic tube scanner
single axle drive for accurate scanning
motor controls the intelligent injection mode
AFM-M Multi-mode Atomic Force Microscope
strong anti-vibration performance
simple and easy laser adjustment
single axle drive for accurate scanning
motor controls the intelligent injection mode
adopt spring for vibration isolation
optical position for real-time observation and locating scanning area of probe sample
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